DC HiPot

D HIP 1500V ROFF 1mA >100M 3T 10S

HiPot testing, short for “high potential,” involves putting electronic devices through rigorous voltage and current stress to ensure they can handle extreme conditions. Electrical insulation can be tested with a hipot tester to make sure it can withstand the device’s load and prevent electric shock from occurring during regular operation. The device is exposed to a high voltage for an extended period, simulating the effects of a failure in a dielectric withstand test. Measurements of low resistance and high-current outputs are two of the most useful tests a hipot tester can perform.

The tag letter “D” is used for a low order leakage test – no scan. The only valid limits for this test are .5mA, 1mA, 1.5mA, 2mA or 2.5mA. DC Hipot tests MAY have a minimum dwell time but this is not necessary to perform the test.

Source: NETS User Manual, Revision D, document 132-06035-0006, section 4.4.6.