High Order Leakage Insulation Test

S 500V >100M .15T .2S

The opposite of an Low Order Leakage test, which is a higher order bulk scan test. This test compares the reference address (output) to all addresses that are higher, up to the highest point of the switching system.

The tag letter “S” is a standard use for a high order leakage test. Whenever using a voltage above 30V, a minimum dwell should be applied.

Source: NETS User Manual, Revision D, document 132-06035-0006, section 4.4.4.